Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.